The motion of edge dislocations in a single monolayer film of Cu on Ru
(0001) was studied by time-resolved scanning tunneling microscopy. The
dislocations were observed to make rapid ID random walks in the film:
This dislocation motion is attributed to the equilibrium thermal exch
ange of atoms: between the solid film and the adatom gas covering the
film. These results highlight a fundamental difference between the dyn
amics of dislocations in thin films and the bulk, which is in principl
e important in understanding the mechanical properties of thin films.