Characteristics of InAlGaAs/InAlAs superlattice avalanche photodiodes for ultra-low optical power detection in the near infrared

Citation
Y. Saito et al., Characteristics of InAlGaAs/InAlAs superlattice avalanche photodiodes for ultra-low optical power detection in the near infrared, OPT REV, 6(5), 1999, pp. 459-463
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICAL REVIEW
ISSN journal
13406000 → ACNP
Volume
6
Issue
5
Year of publication
1999
Pages
459 - 463
Database
ISI
SICI code
1340-6000(199909/10)6:5<459:COISAP>2.0.ZU;2-2
Abstract
Static characteristics of two different structured InAlGaAs/InAlAs superlat tice avalanche photodiodes (SLAPDs) cooled by liquid nitrogen were evaluate d at a wavelength of 1.5 mu m. The dark current of the SLAPD having a thick superlattice layer of 0.504 mu m was 5 x 10(-13) A. This was successively reduced by four orders of magnitude compared to that of the thin layer SLAP D of 0.231 mu m at a breakdown voltage of around 20 V. The thickened layer was effective in suppressing tunneling dark current. An output current of 1 .7 x 10(-12) A at a bias voltage of 15 V was measured for an optical input with a wavelength of 1.5 mu m and a signal power of 1 x 10(-12) W. This sho wed a sharp distinction from the dark current.