Electronic structure of Si and Ge gold-doped clathrates

Citation
Rfw. Herrmann et al., Electronic structure of Si and Ge gold-doped clathrates, PHYS REV B, 60(19), 1999, pp. 13245-13248
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
19
Year of publication
1999
Pages
13245 - 13248
Database
ISI
SICI code
0163-1829(19991115)60:19<13245:ESOSAG>2.0.ZU;2-P
Abstract
The electronic properties of single phase type-I clathrate compounds, Ba8Au 6(Si or Ge)(40) and Ba8Ge46-x have been investigated. The crystal structure , electrical resistivities, magnetic susceptibilities, the density of state s at the Fermi level, and the band gap (where applicable) were determined. Ba8Au6Si40 and Ba8Au6Ge40 show a metallic behavior whereas Ba8Ge46-x is sem iconducting. On a basis of this work, a first evidence is presented of the existence of type-I mixed-clathrates containing both silicon and germanium. [S0163-1829(99)09743-X].