Specular x-ray reflectivity has been used to study the changes in the therm
al fluctuation behavior of eight layer freely suspended N-(4-n-butoxybenzil
idene) -4-n-octylaniline (4O.8) films during the process of successive laye
r-by-layer crystallizations. Each of these steps is preceded by the formati
on of an-intermediate layer structure with in-plane hexatic ordering. We fi
nd an unusually large reduction of the fluctuations after the emergence of
only the first hexatic toplayer. The fluctuation profiles over the film are
in all cases quenched at the surfaces though less so after each crystalliz
ation step. This behavior supports theoretical arguments that heretic order
is reduced by out-of-plane smectic layer fluctuations. [S1063-651X(99)5111
1-2].