Radial distribution analysis of amorphous Ge1-xSe2.5Snx by X-ray diffraction

Citation
Sa. Fayek et al., Radial distribution analysis of amorphous Ge1-xSe2.5Snx by X-ray diffraction, PHYS LOW-D, 9-10, 1999, pp. 173-181
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
9-10
Year of publication
1999
Pages
173 - 181
Database
ISI
SICI code
0204-3467(1999)9-10:<173:RDAOAG>2.0.ZU;2-R
Abstract
The structure of Ge/Se/Sn glasses at nominal compositions Ge1Se2.5, Ge0.8Se 2.5Sn0.2, Ge0.6Se2.5Sn0.4 and Ge0.4Se2.5Sn0.6 have been studied by means of radial distribution function (RDF). The structure is discussed in terms of the structure factor F(Q) and the radial distribution function J(r). The r adial distribution function measures the coordination around an average ato m; however, combined with other sources of information, the nearest neighbo r coordination of the constituent atoms has been determined from the main f irst and second peaks in the RDF's. These peaks are 0.246 (0.262 nm) for r( 1) and 0.398 (0.418 nm) for r(2), respectively. These results are compared with earlier results obtained using the Mossbauer spectroscopy.