Predictions of integrated circuit serviceability in space radiation fields

The present paper suggests an approach to estimating and predicting the ser viceability of on-board electronic equipment. It is based on the postulates of the reliability theory and accounts for total-dose and single-event rad iation effects as well as other exterior destabilizing factors. The methods of determination of failure and upset rates for CMOS devices are considere d. The probability of non-failure operation of a two CMOS RAM is calculated along the whole trajectory of the "Solar Probe" spacecraft. (C) 1999 Elsev ier Science Ltd. All rights reserved.