Recent studies have demonstrated that p.p.m. levels of rare-earth dopant io
ns (e.g. Y, La, Nd) wield a beneficial and highly potent influence on the c
reep properties of alumina. In addition, codoping with ions of disparate si
zes (Nd, Zr) resulted in even further enhancement of the creep behavior. In
all cases, the dopant ions were found to strongly segregate to grain bound
aries. Creep rates were not influenced by the presence of second phase prec
ipitates, verifying that the creep improvement is a solid solution effect.
Ln an attempt to clarify the exact mechanism(s) that controls creep behavio
r of the doped aluminas, various advanced characterization techniques have
been applied including: secondary ion mass spectrometry, scanning transmiss
ion electron microscopy, orientation image microscopy, and extended X-ray a
bsorption fine structure as well as atomistic computer simulation and studi
es of the creep kinetics. Although no definitive mechanism has been establi
shed, a logical explanation is that outsize ions segregate to more energeti
cally favorable grain boundary sites, and improve creep resistance by block
ing a few critical diffusive pathways. This mechanism is sufficiently gener
al that it may be applicable to other ceramic systems. (C) 1999 Acta Metall
urgica Inc. Published by Elsevier Science Ltd. All rights reserved.