AlN : TbF3 electroluminescence thin film prepared by radio-frequency magnetron sputtering

Citation
Yl. Zhao et al., AlN : TbF3 electroluminescence thin film prepared by radio-frequency magnetron sputtering, CHIN PHYS L, 16(11), 1999, pp. 841-843
Citations number
10
Categorie Soggetti
Physics
Journal title
CHINESE PHYSICS LETTERS
ISSN journal
0256307X → ACNP
Volume
16
Issue
11
Year of publication
1999
Pages
841 - 843
Database
ISI
SICI code
0256-307X(1999)16:11<841:A:TETF>2.0.ZU;2-M
Abstract
High quality AIN thin films doped with TbF3 were prepared by rf magnetron r eaction sputtering. High purity Al metal and TbF3 were used as target mater ials with N-2 and Ar as sputtering gases. The influence of preparation cond itions on the photoluminescence brightness was studied, and the electrolumi nescence was found to have a similar dependence on the concentration of TbF 3 and substrate temperature. The characteristic emission of Tb3+ ions was o btained in an AlN:TbF3 alternating current thin film electroluminescence de vice prepared with 600 degrees C substrate temperature and 4.0 mol% concent ration of TbF3.