Short-channel AlGaN/GaN HEMTs with 70 nm T-gate

Citation
O. Breitschadel et al., Short-channel AlGaN/GaN HEMTs with 70 nm T-gate, ELECTR LETT, 35(23), 1999, pp. 2018-2019
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
23
Year of publication
1999
Pages
2018 - 2019
Database
ISI
SICI code
0013-5194(19991111)35:23<2018:SAHW7N>2.0.ZU;2-F
Abstract
The authors have fabricated AlGaN/GaN HEMTs with gate-lengths down to 70 nm to investigate DC- and high frequency characteristics and the breakdown be haviour, respectively. Comparisons with HEMTS fabricated on the same wafer but with a longer gate-length (2 mu m) are presented as well. The 70 nm dev ices have a transconductance of similar to 155 mS/mm, f(T), is 43 GHz and f (max), similar to 100GHz. Toe breakdown voltage reaches 27 V at I-D 550mA/m m.