ETCH ALIGNMENT OF CCD MOSAIC HYBRID

Citation
Sc. Chapman et al., ETCH ALIGNMENT OF CCD MOSAIC HYBRID, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 20(2), 1997, pp. 133-140
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
ISSN journal
10709894
Volume
20
Issue
2
Year of publication
1997
Pages
133 - 140
Database
ISI
SICI code
1070-9894(1997)20:2<133:EAOCMH>2.0.ZU;2-V
Abstract
By relying on semiconductor lithography and processing techniques, we have fabricated a flat, precision aligned charge-coupled device (CCD) mosaic for astronomy. Modifications to the lithographic techniques use d in micromachining lead to a significant reduction in various residue deposits, allowing a smooth surface suitable for CCD alignment, Detai ls of the technique and the fabrication of a prototype mosaic are desc ribed, The composite device is flat to within +/-5 mu m, with rows/col umns oriented to within 20 ppm, The use of an existing technology with built in precision reduces many of the difficulties and expenses typi cally encountered with mosaic detector construction.