Ge-on-Si approaches to the detection of near-infrared light

Citation
L. Colace et al., Ge-on-Si approaches to the detection of near-infrared light, IEEE J Q EL, 35(12), 1999, pp. 1843-1852
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF QUANTUM ELECTRONICS
ISSN journal
00189197 → ACNP
Volume
35
Issue
12
Year of publication
1999
Pages
1843 - 1852
Database
ISI
SICI code
0018-9197(199912)35:12<1843:GATTDO>2.0.ZU;2-I
Abstract
We review our recent results on Ge-based near-infrared photodetectors grown on silicon. We fabricated metal-semiconductor-metal photodetectors based o n epitaxial pure-Ge grown on silicon by Chemical Vapor Deposition, Material characterization and device performances are illustrated and discussed. Ex ploiting a novel approach based on evaporation of polycrystalline-Ge on sil icon, we also realized efficient near-infrared photodiodes with good speed and sensitivity. Finally, multiple-element devices were designed, fabricate d, and tested, such as a voltage-tunable wavelength-selective photodetector based on a SiGe superlattice and a linear array of 16 photodetectors in po ly- Ge on Si.