Reliability of optical branching devices

Authors
Piccirillo, A Zaffiro, G Tambosso, T Gallo, G
Citation
A. Piccirillo et al., Reliability of optical branching devices, IEEE S T QU, 5(5), 1999, pp. 1413-1417
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
ISSN journal
1077260X → ACNP
Volume
5
Issue
5
Year of publication
1999
Pages
1413 - 1417
Database
ISI
SICI code
1077-260X(199909/10)5:5<1413:ROOBD>2.0.ZU;2-8
Abstract
We present the results of a 5000-h life test at 85 degrees C/85% RH on comm ercial planar and fused-fiber optical splitters. After Considering possible mechanisms of failure a preliminary failure rate is estimated. Experimenta l results demonstrate that the manufacturing process has to be improved and an effective screening procedure should be envisaged in order to obtain hi ghly reliable couplers.