Double-recess power metamorphic high electron mobility transistors (MHEMT's
) on GaAs substrates were successfully demonstrated. The In(.53)A(.47)As/In
(.65)Al(.35)AS structures exhibited extrinsic transconductance of 1050 mS/m
m and breakdown of 8.3 V, which are comparable to that of the InP power HEM
T, Excellent maximum power added efficiency (PAE) of 60.2% with output powe
r of 0.45 W/mm and record associated power gain of 17.1 dB were realized at
20 GHz, A maximum output power of 0.51 W/mm has also been demonstrated,vit
h the device, This is the first demonstration of high-efficiency K-band pow
er MHEMT's.