Temperature and optical characteristics of tin oxide membrane gate ISFET

Citation
Hk. Liao et al., Temperature and optical characteristics of tin oxide membrane gate ISFET, IEEE DEVICE, 46(12), 1999, pp. 2278-2281
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
46
Issue
12
Year of publication
1999
Pages
2278 - 2281
Database
ISI
SICI code
0018-9383(199912)46:12<2278:TAOCOT>2.0.ZU;2-P
Abstract
The influence of temperature and optical effects on ISFET performance are i mportant. In this study, the temperature characteristics of the SnO2/Si3N4/ SiO2/Si ISFET are investigated by the zero temperature coefficient (T.C.) a djustment and the dual FET's configuration, respectively. The result show t hat a zero T.C. of the SnO2 gate ISFET can be achieved when the appropriate operation current was set. Subsequently, the T.C. of tin oxide membrane/el ectrolyte interfacecan be evaluated by the dual FET's configuration, On the other hand, due to the SnO2 gate ISFET is sensitive to the light exposure, thus in order to improve this drawback, a multi-structure ISFET's: SnO2/Al /SiO2/Si3N4/Si ISFET's have been developed, in this structure, aluminum is used as a light shield, and the tin oxide is used as a pH sensitive layer. The results show the ISFET's with aluminum as a light shield have low light sensitivity compared with ISFET's without aluminum as a light shield.