The dynamic response analysis of a pyroelectric thin-film infrared sensor with thermal isolation improvement structure

Citation
Jj. Ho et al., The dynamic response analysis of a pyroelectric thin-film infrared sensor with thermal isolation improvement structure, IEEE DEVICE, 46(12), 1999, pp. 2289-2294
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
46
Issue
12
Year of publication
1999
Pages
2289 - 2294
Database
ISI
SICI code
0018-9383(199912)46:12<2289:TDRAOA>2.0.ZU;2-Z
Abstract
Both thoretical and experimental studies of the substrate effect on the the rmal behavior of a PbTiO3 infrared (IR) sensor have been reported. With act ive cantilever dimensions of 200 x 100 x 5 mu m(3) formed by etching proces ses, the pyroelectric micro-electro-mechanical system (pyro/MEMS) structure exhibits a much superior performance to that of a traditional IR-sensing b ulk structure under the 800-mu W incident optical light with wavelength of 970 nm, Two-order improvement in current responsivity is obtained for the p yro/MEMS structure. This shows the substrate effect on the performance of a pyro/MEMS IR sensor is very significant. A simple model has also been prop osed to illustrate the substrate effect more comprehensively.