Comments on "Negative capacitance effect in semiconductor devices" - Reply

Authors
Ershov, M Liu, HC Li, L Buchanan, M Wasilewski, ZR Jonscher, AK
Citation
M. Ershov et al., Comments on "Negative capacitance effect in semiconductor devices" - Reply, IEEE DEVICE, 46(12), 1999, pp. 2358-2358
Citations number
3
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
46
Issue
12
Year of publication
1999
Pages
2358 - 2358
Database
ISI
SICI code
0018-9383(199912)46:12<2358:CO"CEI>2.0.ZU;2-Z