J. Nishizawa et T. Kurabayashi, Diffusion control of dopant from heavily Se doped n type GaAs layers grownby molecular layer epitaxy, JPN J A P 1, 38(11), 1999, pp. 6193-6196
Properties of GaAs grown by molecular layer epitaxy are strongly influenced
by surface stoichiometry during growth, In molecular layer epitaxy, Se is
introduced for the heavily doped n(+ +) layers for device applications. In
such layers, Se exists as an interstitial atom and behaves as a diffusion s
ource. In the growth process, the diffusion of doped Se into GaAs is affect
ed by the supply pressure of AsH3; a higher amount of AsH3 supplied during
the growth of the undoped layer in an n(+ +)-i structure reduces the diffus
ion of Se. A lower amount of AsH3 supplied during the growth of the n(+ +)
layer reduces the diffusion of Se from the n(+ +) layer to the i layer. The
stoichiometry in i and n(+ +) layers affects the diffusion of interstitial
Se in different manners.