Diffusion control of dopant from heavily Se doped n type GaAs layers grownby molecular layer epitaxy

Citation
J. Nishizawa et T. Kurabayashi, Diffusion control of dopant from heavily Se doped n type GaAs layers grownby molecular layer epitaxy, JPN J A P 1, 38(11), 1999, pp. 6193-6196
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
38
Issue
11
Year of publication
1999
Pages
6193 - 6196
Database
ISI
SICI code
Abstract
Properties of GaAs grown by molecular layer epitaxy are strongly influenced by surface stoichiometry during growth, In molecular layer epitaxy, Se is introduced for the heavily doped n(+ +) layers for device applications. In such layers, Se exists as an interstitial atom and behaves as a diffusion s ource. In the growth process, the diffusion of doped Se into GaAs is affect ed by the supply pressure of AsH3; a higher amount of AsH3 supplied during the growth of the undoped layer in an n(+ +)-i structure reduces the diffus ion of Se. A lower amount of AsH3 supplied during the growth of the n(+ +) layer reduces the diffusion of Se from the n(+ +) layer to the i layer. The stoichiometry in i and n(+ +) layers affects the diffusion of interstitial Se in different manners.