Investigation of antiferroelectric liquid crystalline free-standing films by transmission ellipsometry

Citation
H. Kobayashi et al., Investigation of antiferroelectric liquid crystalline free-standing films by transmission ellipsometry, JPN J A P 1, 38(11), 1999, pp. 6428-6432
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
38
Issue
11
Year of publication
1999
Pages
6428 - 6432
Database
ISI
SICI code
Abstract
Thin free-standing films (FSFs) of an antiferroelectric liquid crystal (AFL C) were investigated by transmission ellipsometry. The phase difference bet ween p-polarized and s-polarized light was measured as a function of the te mperature and the incidence angle of the light beam. It was found that the structure of an FSF with two layers is anticlinic (SmCA*) throughout the te mperature range investigated whereas the bulk sample shows several phases, from SmCA* to SmA phases. The four layer FSF showed only one phase transiti on (from SmCA* to SmA) in this temperature range. Even for such a thin film as one with five layers, a subphase or subphases between SmCA* and SmA wer e found.