X-ray diffraction studies of epitaxial La0.5Sr0.5CoO3 thin films prepared by the dipping-pyrolysis process

Authors
Hwang, K Lee, H Ryu, H Lim, Y Yamaguchi, I Manabe, T Kumagai, T Mizuta, S
Citation
K. Hwang et al., X-ray diffraction studies of epitaxial La0.5Sr0.5CoO3 thin films prepared by the dipping-pyrolysis process, JPN J A P 1, 38(11), 1999, pp. 6489-6490
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
38
Issue
11
Year of publication
1999
Pages
6489 - 6490
Database
ISI
SICI code
Abstract
A reciprocal-space map (omega-2 theta scans) can provide more information t han conventional X-ray diffraction (XRD) theta-2 theta scans. In this study , an epitaxial La0.5Sr0.5CoO3 thin film prepared on the SrTiO3(100) substra te by the dipping-pyrolysis (DP) process was investigated based on XRD thet a-2 theta scanning, beta scanning (pole figure) and asymmetric omega-2 thet a scanning. An epitaxial La0.5Sr0.5CoO3 film annealed at 800 degrees C was found to consist of the pseudocubic phase with a d(parallel to)/d(perpendic ular to) ratio of 1.005 by reciprocal-space map analysis.