Phase-Shifting,X-Ray shearing interferometer

We propose an X-ray shearing interferometer, where two slightly sheared X-r ay beams are produced, both of which are transmitted through an object. The two beams are superposed and interfere after they are transmitted through the interferometer. The interfered beams show intensity variation due to th e phase difference between the sheared beams. To measure the phase differen ce, the phase-shift method is introduced. To obtain the phase shift, an acr ylic wedge is rotated. This interferometer is constructed by monolithical c utting from a single silicon crystal. The phase difference distribution alo ng a line is obtained by detecting the X-ray intensity at a point and scann ing the objects mechanically. Some simple objects made of acrylic resin are measured with good contrast, showing the validity of the interferometer.