Phase relations in the ternary Ti-Si-Ga system have been established experi
mentally by means of a study of alloy samples in the as-cast condition and
annealed at 1350 degrees C. The alloys were prepared by are melting. The in
vestigation was carried out using physico chemical methods of analyses (met
allography, X-ray powder diffraction, differential thermal analysis, and el
ectron probe microanalysis over a limited composition range with samples co
ntaining less than 38 at.% Ga and more than 62 at.% Ti. Liquidus and solidu
s surface projections, the isothermal section at 1350 degrees C, and the is
opleth at 68 at. % Ti are presented. Three surfaces of primary crystallizat
ion of phases have been established: extended ones for Ti-5(Si,Ga)(3) and b
eta (Ti-base solid solution) and a narrow one of Ti2Ga. The monovariant cur
ves separating these are due to the eutectic reactions L <----> beta + Ti-5
(Si,Ga)(3) and L <----> beta + Ti2Ga and to the L + Ti-5(Si,Ga)(3) <----> T
i2Ga peritectic reaction. The three-phase region (beta + Ti-5(Si,Ga)(3) + T
i2Ga) results from the four-phase eutectic reaction L <----> beta + Ti-5(Si
,Ga)(3) + Ti2Ga. The composition of the ternary eutectic point E and the co
mpositions of the coexisting solid phases have been determined. The solubil
ities of Si in the gallides, and of Ga in Ti5Si3 and of both the elements i
n Ti are given.