Vectorial diffraction patterns and limits of Brewster ellipsometry

Authors
Froehly, L Verrier, I Froehly, C Brun, G Veillas, C
Citation
L. Froehly et al., Vectorial diffraction patterns and limits of Brewster ellipsometry, OPT COMMUN, 171(4-6), 1999, pp. 195-204
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
171
Issue
4-6
Year of publication
1999
Pages
195 - 204
Database
ISI
SICI code
0030-4018(199912)171:4-6<195:VDPALO>2.0.ZU;2-S
Abstract
A vectorial modulation transfer function approach of diffraction patterns o bservable around Brewster's incidence is proposed. The good agreement betwe en experimental results and vectorial model will allow the correlation of r efractive index measurement accuracy with the average magnitude of surface defects. Consequences in the metrology of refractive index gradients will t hen be briefly discussed. (C) 1999 Elsevier Science B.V. All rights reserve d.