Miniaturized time-scanning Fourier transform spectrometer based on silicontechnology

Citation
O. Manzardo et al., Miniaturized time-scanning Fourier transform spectrometer based on silicontechnology, OPTICS LETT, 24(23), 1999, pp. 1705-1707
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
24
Issue
23
Year of publication
1999
Pages
1705 - 1707
Database
ISI
SICI code
0146-9592(199912)24:23<1705:MTFTSB>2.0.ZU;2-5
Abstract
We present a miniaturized Fourier transform spectrometer (FTS) based on opt ical microelectromechanical system technology. The FTS is a Michelson inter ferometer with one scanning mirror. A new type of electrostatic comb drive actuator moves the mirror. We have measured a nonlinearity of the driving s ystem of +/-0.5 mu m for a displacement of 38.5 mu m. A method is presented to correct the spectrum to get rid of the nonlinearity. The driving reprod ucibility is +/-25 nm. The measured resolution of the spectrometer after th e phase correction is 6 nm at a wavelength of 633 nm. (C) 1999 Optical Soci ety of America.