MOCVD-epitaxy on free-standing HVPE-GaN substrates

Citation
Cr. Miskys et al., MOCVD-epitaxy on free-standing HVPE-GaN substrates, PHYS ST S-A, 176(1), 1999, pp. 443-446
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
176
Issue
1
Year of publication
1999
Pages
443 - 446
Database
ISI
SICI code
0031-8965(19991116)176:1<443:MOFHS>2.0.ZU;2-P
Abstract
Free-standing GaN substrates of up to 2 " diameter can be produced hy delam ination of thick HVPE (hydride vapour phase epitaxy) films from sapphire wi th a laser-induced liftoff process. Homoepitaxial films of up to 2 mu m thi ckness were grown on the Ga-face and N-face of these substrates with a low- pressure MOCVD system. The pre-overgrowth polishing of the substrates influ ences the final surface morphology and growth modus, which also depend on t he crystal polarity. PL spectra resolve the bound and free exciton peaks fr om the overgrown GaN.