The effect of grain boundaries on electrical properties of thin GaN layers
is studied by photoconductivity and its functional dependence on surface ph
otovoltage, and by resistance changes produced by ion implantation damage.
These two independent experiments provide strong evidence that the conducti
vity in GaN can be described by the Grain Boundary Controlled Transport mod
el. According to this model, charged interface states at the grain boundari
es form potential barriers for inter-grain conduction.