The effect of grain boundaries on electrical conductivity in thin GaN layers

Citation
J. Salzman et al., The effect of grain boundaries on electrical conductivity in thin GaN layers, PHYS ST S-A, 176(1), 1999, pp. 683-687
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
176
Issue
1
Year of publication
1999
Pages
683 - 687
Database
ISI
SICI code
0031-8965(19991116)176:1<683:TEOGBO>2.0.ZU;2-M
Abstract
The effect of grain boundaries on electrical properties of thin GaN layers is studied by photoconductivity and its functional dependence on surface ph otovoltage, and by resistance changes produced by ion implantation damage. These two independent experiments provide strong evidence that the conducti vity in GaN can be described by the Grain Boundary Controlled Transport mod el. According to this model, charged interface states at the grain boundari es form potential barriers for inter-grain conduction.