We report the reactive ion etching of gallium nitride (GaN) using methylchl
oride/hydrogen, CH3Cl/H-2,. The effect of the rf power input, total gas flo
w rate, pressure and gas chemistry on etch rate were investigated and the o
ptimum process identified using the orthogonal design method. Etch rates of
100 nm/min have been obtained. A study of the effect of etching on the con
tact resistance vias carried out which showed an increase in resistance for
etched samples.