Precision measurements of the line profile by the diode laser spectroscopic method

Citation
Ai. Nadezhdinskii et al., Precision measurements of the line profile by the diode laser spectroscopic method, QUANTUM EL, 29(10), 1999, pp. 916-920
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
QUANTUM ELECTRONICS
ISSN journal
10637818 → ACNP
Volume
29
Issue
10
Year of publication
1999
Pages
916 - 920
Database
ISI
SICI code
1063-7818(199910)29:10<916:PMOTLP>2.0.ZU;2-U
Abstract
Problems of the precision measurements of spectral line parameters by diode -laser spectroscopic methods were examined. The instrumental function of a diode laser spectrometer was investigated in detail. The knowledge of the l atter makes it possible to solve correctly the problem of the 'optical zero ' and to reconstruct the true line profile with an error less than 1%. The instrumental function of a diode laser spectrometer was determined for the example of a laser diode emitting radiation at the wavelength lambda = 1.53 mu m. The function represents the convolution of two Lorentzian functions with the characteristic half-widths Delta v(1) and Delta g, which vary not only from mode to mode but also within the limits of a single radiation mod e.