Predicting nonlinear effects in superconducting microwave transmission lines from mutual inductance measurements

We demonstrate the use of a new experimental technique based on mutual indu ctance measurements to quantitatively predict nonlinear effects in microwav e devices fabricated from high-temperature superconductor (HTS) materials. The mutual inductance measurements yield the current dependence of the pene tration depth lambda(J) in unpatterned HTS thin films. This information is used to calculate third-harmonic generation in coplanar waveguide (CPW) tra nsmission lines and compares very well with actual measurements of CPW tran smission lines of variable dimensions fabricated from YBa2Cu3O7-delta thin film samples. The mutual inductance measurements should prove extremely val uable as a screening technique for microwave applications of HTS materials that require very low nonlinear response.