Measurements of the dielectric properties of strontium titanate at submillimetre wavelengths using Josephson junction driven oscillators

Citation
Pf. Mcbrien et al., Measurements of the dielectric properties of strontium titanate at submillimetre wavelengths using Josephson junction driven oscillators, SUPERCOND S, 12(11), 1999, pp. 819-822
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
ISSN journal
09532048 → ACNP
Volume
12
Issue
11
Year of publication
1999
Pages
819 - 822
Database
ISI
SICI code
0953-2048(199911)12:11<819:MOTDPO>2.0.ZU;2-#
Abstract
Measurements of the dielectric constant ER Of thin-film SrTiO3 made using J osephson junction driven oscillators are reported. ER for a 100 nm SrTiO3 f ilm was found to vary between 120 and 245 in the temperature range from 4.2 K to 65 K and to be independent of frequency from 50 GHz to 340 GHz.