Soft X-ray resonant magnetic scattering from thin Ni layers on Cu(110)

Citation
M. Sacchi et al., Soft X-ray resonant magnetic scattering from thin Ni layers on Cu(110), SURF SCI, 442(3), 1999, pp. 349-356
Citations number
40
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
442
Issue
3
Year of publication
1999
Pages
349 - 356
Database
ISI
SICI code
0039-6028(199912)442:3<349:SXRMSF>2.0.ZU;2-X
Abstract
Resonant scattering of elliptically polarised soft X-rays has been used to investigate the magnetic properties of thin uncapped Ni layers grown on Cu( 110). In our experiment, performed at room temperature, Ni is found to have no net magnetic moment in the surface plane up to 6 ML. Starting from 10 a nd up to 30 ML a magnetic signal is observed that can be reproduced by calc ulations which assume the bulk magnetic properties of Ni. Our results are c ompared to those of previous studies on Ni/Cu(001) layers. (C) 1999 Elsevie r Science B.V. All rights reserved.