Metrology creates respect for the law - Lack of metrology generates contempt of the law

Authors
De Bievre, P
Citation
P. De Bievre, Metrology creates respect for the law - Lack of metrology generates contempt of the law, ACCRED Q A, 4(12), 1999, pp. 497-497
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ACCREDITATION AND QUALITY ASSURANCE
ISSN journal
09491775 → ACNP
Volume
4
Issue
12
Year of publication
1999
Pages
497 - 497
Database
ISI
SICI code
0949-1775(199912)4:12<497:MCRFTL>2.0.ZU;2-S