Phase jumps and interferometric surface plasmon resonance imaging

Citation
An. Grigorenko et al., Phase jumps and interferometric surface plasmon resonance imaging, APPL PHYS L, 75(25), 1999, pp. 3917-3919
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
25
Year of publication
1999
Pages
3917 - 3919
Database
ISI
SICI code
0003-6951(199912)75:25<3917:PJAISP>2.0.ZU;2-R
Abstract
Conditions at which phase of light demonstrates a markedly different behavi or for close values of system parameters as well as the Heaviside jump are discussed and explained in terms of phase topology. On this basis, a method of interferometric surface plasmon resonance imaging is proposed and appli ed to develop ultrasensitive affinity array sensors with a monoatomic thick ness resolution. (C) 1999 American Institute of Physics. [S0003-6951(99)018 51-3].