Correlating the location of structural defects with the electrical failureof multiwalled carbon nanotubes

Authors
de Pablo, PJ Howell, S Crittenden, S Walsh, B Graugnard, E Reifenberger, R
Citation
Pj. De Pablo et al., Correlating the location of structural defects with the electrical failureof multiwalled carbon nanotubes, APPL PHYS L, 75(25), 1999, pp. 3941-3943
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
25
Year of publication
1999
Pages
3941 - 3943
Database
ISI
SICI code
0003-6951(199912)75:25<3941:CTLOSD>2.0.ZU;2-E
Abstract
Electrical failure of carbon nanotubes was investigated by obtaining I(V) d ata with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncon tact scanning force microscope images were obtained before and after each I (V) curve until electrical failure of the tube resulted. Following this pro cedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure. (C) 1999 American Institute of Physics. [S0003-6951(99)01151-1].