Air-bridge-structured silicon nanowire and anomalous conductivity

Citation
H. Fujii et al., Air-bridge-structured silicon nanowire and anomalous conductivity, APPL PHYS L, 75(25), 1999, pp. 3986-3988
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
25
Year of publication
1999
Pages
3986 - 3988
Database
ISI
SICI code
0003-6951(199912)75:25<3986:ASNAAC>2.0.ZU;2-Q
Abstract
An air-bridge-structured silicon nanowire was made by micromachining a sili con-on-insulator (SOI) substrate and electrically characterized. The nanowi re was isolated from the substrate by an air gap and typically 20-100 nm in diameter and 300-600 nm in length. Current-voltage characteristics of thes e wires were anomalous electric conductivity such as negative resistance an d hysteresis at room temperature. Charge accumulation into surface states i s considered a dominant characteristic. (C) 1999 American Institute of Phys ics. [S0003-6951(99)03751-1].