Near-field photoconductivity of stretch-oriented poly(para-phenylene vinylene)

Citation
Ja. Dearo et al., Near-field photoconductivity of stretch-oriented poly(para-phenylene vinylene), APPL PHYS L, 75(24), 1999, pp. 3814-3816
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
24
Year of publication
1999
Pages
3814 - 3816
Database
ISI
SICI code
0003-6951(199912)75:24<3814:NPOSPV>2.0.ZU;2-X
Abstract
Near-field scanning optical microscopy (NSOM) with photoconductivity contra st is used to map the transport properties of stretch-oriented poly(p-pheny lene vinylene) thin films on a 150 nm length scale. Near-field photoconduct ivity is highly sensitive to film morphology and contrast is observed even in films with uniform photoluminescence. Regions of relatively higher photo current signals are correlated to regions with higher molecular order which have contrast approaching 15%. In addition, the photocurrent signal decrea ses sharply as the near-field tip approaches the surface of the film while at the same time the photoluminescence signal increases. The sharp decrease is attributed to the perturbation of the applied electric field within the polymer film by the metal on the NSOM tip. (C) 1999 American Institute of Physics. [S0003-6951(99)04248-5].