Near-field scanning optical microscopy (NSOM) with photoconductivity contra
st is used to map the transport properties of stretch-oriented poly(p-pheny
lene vinylene) thin films on a 150 nm length scale. Near-field photoconduct
ivity is highly sensitive to film morphology and contrast is observed even
in films with uniform photoluminescence. Regions of relatively higher photo
current signals are correlated to regions with higher molecular order which
have contrast approaching 15%. In addition, the photocurrent signal decrea
ses sharply as the near-field tip approaches the surface of the film while
at the same time the photoluminescence signal increases. The sharp decrease
is attributed to the perturbation of the applied electric field within the
polymer film by the metal on the NSOM tip. (C) 1999 American Institute of
Physics. [S0003-6951(99)04248-5].