Low-energy electron-excited nanoscale-luminescence (LEEN) spectroscopy of G
aN/InGaN/GaN double-heterojunction structures reveal the formation of elect
ronic states localized near the quantum well interfaces under relatively In
-rich conditions. These states are due to formation in a cubic GaN region c
omparable to the quantum well layer in thickness rather than the bulk nativ
e defects typically associated with growth quality. The nanoscale depth dep
endence of the noncontact, nondestructive LEEN technique enables detection
of this competitive recombination channel within a few nanometers of the "b
uried" heterojunction interfaces. (C) 1999 American Institute of Physics. [
S0003-6951(99)01250-4].