Rf. Wang et al., Absolute measurement of penetration depth in a superconducting film by thetwo-coil technique, APPL PHYS L, 75(24), 1999, pp. 3865-3867
A two-coil mutual-inductance apparatus that is optimized to allow for the m
easurement of the absolute value of penetration depth lambda in superconduc
ting films is described. Nb films with thickness d ranging from 20 to 90 nm
are used to illustrate the measurement. For a 70-nm-thick Nb film at 4.2 K
, with d/lambda similar to 0.6, the uncertainty in the measured lambda is a
bout +/- 2.3%. From the results on the Nb film series, we show that a satis
factory determination of the absolute value of lambda is possible for these
films with d/lambda < 0.95. (C) 1999 American Institute of Physics. [S0003
-6951(99)05146-3].