In this paper we have studied the island formation during InAs/Si(100) thre
e dimensional (3D) heteroepitaxial growth using RHEED, SEM and TEM methods.
We have found the strong influence of the growth conditions on the surface
morphology. Both an important role during the growth in InAs/Si are formed
at the Si(100) when lateral size is less kinetic and energetic parameters
play system. Dislocation-free InAs islands then 5 nm.