In situ surface X-ray diffraction studies of electrochemical interfaces ata high-energy third-generation synchrotron facility

Citation
Vh. Etgens et al., In situ surface X-ray diffraction studies of electrochemical interfaces ata high-energy third-generation synchrotron facility, ELECTR ACT, 45(4-5), 1999, pp. 591-599
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHIMICA ACTA
ISSN journal
00134686 → ACNP
Volume
45
Issue
4-5
Year of publication
1999
Pages
591 - 599
Database
ISI
SICI code
0013-4686(1999)45:4-5<591:ISSXDS>2.0.ZU;2-5
Abstract
We have developed a new spectro-electrochemical cell derived from the three -electrodes standard cell, in order to study the electrolyte/single-crystal interfaces by using surface X-ray diffraction. Results obtained with this cell are described here. We studied the phase transition of gold (111) in s ulfuric acid. Preliminary results are shown concerning the overpotential de position and the new possibilities that are opened by the use of a 2-D X-ra y-sensitive detector. This set-up allowed us to follow in situ and in real time the morphology of Cu growth on Au (001), in free and surfactant-contai ning solution. (C) 1999 Elsevier Science Ltd. All rights reserved.