M. Hirose et al., A large-signal model of self-aligned gate GaAsFET's for high-efficiency power-amplifier design, IEEE MICR T, 47(12), 1999, pp. 2375-2381
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
We propose a large-signal model that can simulate the power-added efficienc
y of p-pocket self-aligned gate GaAs MESFET's, This model includes a new dr
ain current model and a gate bias-dependent RF output resistance to express
the drain conductance and its frequency dispersion at each gate bias. In a
ddition, gate-source and gate-drain capacitances are modeled by functions o
f two variables of gate and drain biases so as to fit the measured values o
f ion implanted channels. The simulated power-added efficiency agreed with
the measured value with a maximum error of 5%, The intermodulation distorti
on was also simulated and the maximum difference between the simulated and
measured results was reduced to one-fifth of the results simulated by the c
onventional model. Practical applications were demonstrated by the load-pul
l simulation and the pi/4 shift QPSK-modulated signal simulation.