E. Mccafferty et Jp. Wightman, Determination of the acid-base properties of metal oxide films and of polymers by contact angle measurements, J ADHES SCI, 13(12), 1999, pp. 1415-1436
The surface isoelectric point for native air-formed oxide films on various
metals has been determined by measurement of contact angles at the hexadeca
ne/aqueous solution interface as a function of the pH of the aqueous phase.
Application of Young's equation. the Gibbs equation, and surface equilibri
a conditions for hydroxylated oxide films leads to a mathematical expressio
n which shows that the contact angle goes though a maximum at the isoelectr
ic point of the oxide. The experimentally determined values for the oxide f
ilms on aluminum, chromium, and tantalum are within one to three pH units o
f the reported isoelectric points for the corresponding bulk oxide powders.
The surface isoelectric point of an oxide-covered Ta-implanted Al surface
lies between that of Al2O3 and Ta2O5 The acid-base properties of various po
lymers, including a commercially available pressure-sensitive adhesive, wer
e determined by measuring the contributions gamma(S)(+) and gamma(S)(-) to
the solid surface free energy using the contact angle approach of van Oss a
nd Good. Adhesion measurements for a pressure-sensitive adhesive having a p
ositive surface charge show that the peel strength is greatest when the met
al substrate has a surface oxide film of basic character.