Parallel-slit analyzer developed for the purpose of lowering tails of diffraction profiles

A parallel-slit analyzer (PSA) has been developed for the purpose of loweri ng tails in diffraction profiles from powders and thin films. In the presen t work, four different materials were used for the foils: sintered and hot- pressed tungsten (W), cold-worked stainless steel (SUS), beryllium bronze ( Cu98Be2) and chemically surface-processed beryllium bronze (CuOx). The PSAs were tested in a parallel-beam geometry using Cu K alpha radiation collima ted with a graded d-spacing parabolic multilayer mirror. The W and CuOx PSA s gave pseudo-Voigt profiles of similar to 80% Gaussian in the direct-beam case. Textured and roughened surfaces of W and CuOx foils are considered ef fective for depressing total-reflection effects from the surfaces of the fo il materials, and consequently for lowering the tails of diffraction peaks.