Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy

Citation
Jk. Kruger et al., Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy, J APPL PHYS, 87(1), 2000, pp. 74-77
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
1
Year of publication
2000
Pages
74 - 77
Database
ISI
SICI code
0021-8979(20000101)87:1<74:SAADOI>2.0.ZU;2-X
Abstract
The use of a new Brillouin spectroscopic technique evidences the existence of internal stresses in white plasma assisted chemical vapor deposited diam ond and allows a first assessment concerning their magnitude. The evaluatio n of the internal stresses is based on the pressure coefficients related to the longitudinal and transverse elastic constants. (C) 2000 American Insti tute of Physics. [S0021- 8979(00)00801-X].