Y. Kim et al., ELECTRICAL-PROPERTIES OF SILICA-POLYIMIDE COMPOSITE DIELECTRIC THIN-FILMS PREPARED VIA SOL-GEL REACTION AND THERMAL IMIDIZATION, Synthetic metals, 85(1-3), 1997, pp. 1399-1400
Thin dielectric films composed of silica and polyimide were prepared f
rom tetraethoxysilane (TEOS) and precursor of poly(p-phenylene bipheny
ltetracarboximide)(BPDA-PDA). Silica particles were generated from TEO
S via sol-gel process. BPDA-PDA polyimide was prepared from its flexib
le and soluble precursors, poly(p-phenylene biphenyltetracarboxamic ac
id)(BPDA-PDA PAA), and poly(p-phenylene biphenyltetracarboxamic diethy
l ester)(BPDA-PDA ES), through thermal imidization process. In the pre
sent work, the electrical properties of the silica-polyimide hybrid co
mposite films were examined utilizing a capacitance measurement by a h
igh resolution electrometer/function generator system. The effects of
TEOS contents and precursor types for polyimide matrix of the composit
es on the relative dielectric constant, dielectric dissipation factor,
and resistivity of the composite films were investigated.