Bx. Shi et al., Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy, J MATER SCI, 34(21), 1999, pp. 5169-5173
The phase detection method of photothermal deflection spectroscopy in the t
ransverse configuration was used to measure the overall thermal diffusivity
of silicon-boron (Si-B) alloy film on Corning 7059 glass substrate. Result
s were attained by observing the phase of deflection of the probe beam when
it scanned above the film surface relative to the pump beam. Measurements
were repeated for different modulation frequencies of the pump beam. Furthe
rmore, both bouncing and skimming configurations were used. The effect of v
arying the distance between the probe beam and film surface was investigate
d. (C) 1999 Kluwer Academic Publishers.