Though germanium (Ge) shares many similar physical properties with silicon
(Si), it also possesses unique characteristics that are complementary to th
ose of Si. The advantages of Ge include its compatibility with Si microfabr
ication, its excellent gas and liquid phase etch selectivity to other mater
ials commonly used in Si micromachining, and its low deposition temperature
(<350 degrees C) that potentially allows Ge to be used after the completio
n of a standard CMOS run. Wider applications of Ge as a structural, sacrifi
cial, and sensor material require a more systematic investigation of its pr
ocessing and properties. The results of such an undertaking are presently r
eported, The topics covered are the formation of Ge thin films and novel ap
plication of the selective deposition of Ge to etch hole filling, character
ization of the effects of thermal treatment on the evolution of the residua
l stress in Ge thin films, etch selectivity for etch mask and sacrificial l
ayer applications, and gas phase release technique for stiction elimination
. [431].