Comparative analysis of plant cuticular waxes using HATR FT-IR reflection technique

Citation
En. Dubis et al., Comparative analysis of plant cuticular waxes using HATR FT-IR reflection technique, J MOL STRUC, 512, 1999, pp. 173-179
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF MOLECULAR STRUCTURE
ISSN journal
00222860 → ACNP
Volume
512
Year of publication
1999
Pages
173 - 179
Database
ISI
SICI code
0022-2860(19991123)512:<173:CAOPCW>2.0.ZU;2-I
Abstract
The utility of horizontal attenuated total reflection HATR FT-IR technique for preliminary plant leaf cuticular waxes qualitative analysis was studied . Detection and identification of small amounts of surface compounds were a chieved. The main components of analysed samples were long-chain aliphatic compounds, mainly hydrocarbons. Weak absorption in the range of 1717-1738 c m(-1) indicated the presence of some compounds containing carbonyl groups. In the case of direct HATR analysis of potato leaf surface, an additional b road band of water was observed. The results obtained by infrared methods a re in good agreement with HPLC analyses. HATR FT-IR is convenient and a rap id method of preliminary evaluation of surface plant material composition, especially for esters, ketones and aldehydes. (C) 1999 Elsevier Science B.V . All rights reserved.