Near-field electron energy loss spectroscopy in porous silicon

First results of an Electron Energy Loss Spectroscopy in the Near Field (NF EELS) mode of n(+) porous silicon are described here. Sequences of EELS spe ctra in the low loss energy range (0-30 eV) were recorded, using a scanning transmission electron microscope, as the e-beam was scanned across a nano- hole surrounded by Si platelets. This technique is shown to be very sensiti ve to spectral and spatial changes in the electromagnetic field distributio n outside the surface of nanoparticles, governed by their local nature and shape.