The future of atomic resolution electron microscopy for materials science

The field of atomic-resolution transmission electron microscopy and its app lication to materials science is reviewed. This technique, whose spatial re solution is now about one Angstrom, is valuable wherever nanoscale characte rization of materials is needed. The history of the subject is briefly outl ined, followed by a discussion of experimental techniques. Resolution-limit ing factors are summarized, together with the underlying theory of image fo rmation. Seven promising approaches to super-resolution are reviewed. The s tatistical principles of quantitative image analysis and defect modelling a re outlined for both HREM and STEM. Methods for obtaining defect energies f rom images are discussed. The review ends with a summary of some recent app lications, including such topics as the Fullerenes, nanotubes, dislocation kink imaging, superconductors, atomic-resolution imaging of whole semicondu ctor devices, the study of atomic defects in mediating first-order phase tr ansitions, collosal magnetoresistance, ceramic interfaces, quasicrystals, i maging of surfaces, glasses, catalysts and magnetic materials. (C) 1999 Pub lished by Elsevier Science S.A. All rights reserved.