Dynamic characterisation of A/D converters using fast Walsh transform

This work presents an application of the Walsh transform to the dynamic cha racterisation of analog-to-digital converters (ADCs). The Walsh Transform ( WT) is an analytical operator that extracts information on ADC parameters a t the bit level rather than at the channel level. The use of the WT allows the performance of an ADC to be summarised with a reduced set of values as compared to the conventional set of non-linearity errors. To limit CPU time , a fast algorithm is used to compute the WT. A characterisation environmen t based on this approach was developed and used to evaluate ADC performance . (C) 1999 Elsevier Science Ltd. All rights reserved.